Process Control Systems

These systems are designed for automated all-surfaces inspections of substrates. They utilize robotic or other non-conveyorized part handlers to provide infeed flexibility, a high degree of part control, and improved cycle time.

CATPRO L77 Brochure

L77: Laser Measurement Center

(Manual part load/unload)

This module inspects for side gouges and edge chips and verifies GD&T-shape parameters on monolith catalytic substrates up to 7" X 8"

CATPRO L612 Brochure

L612: Laser Side Measurement Center

(Manual part load/unload)

This module inspects for side gouges and edge chips and verifies GD&T-shape parameters on segmented catalytic substrates up to 6" X 12"

Call New Gate Technologies to discuss your specific inspection requirements with an application engineer at 406-548-6008 or send an email to dbrekhus@newgatetech.com.

Our solutions detect and measure:

  •  Internal voids and cracks
  •  Face chips, gouges, & cracks
  •  Edge chips
  •  Side chips, gouges, & cracks
  •  Extra plugs
  •  Obstructed channels
  •  Missing plugs
  •  Damaged external channels
  •  Face codes
  •  Face labels
  •  Side barcodes
  •  Side labels
  •  Part measurements